| Aspect | Scanning Probe Microscopy | Atomic Force Microscopy |
|---|
| Credentials | Typically requires a degree in physics, materials science, or engineering | Same as SPM, often with specialized training in AFM techniques |
| Work Environment | Laboratories, research institutions, industrial R&D | Similar environments, often in nanotechnology and materials research |
| Industry Usage | Used across nanotechnology, materials science, biology | Primarily in nanotech, surface science, and biomaterials |
Scanning Probe Microscopy (SPM) is a broad category that includes Atomic Force Microscopy (AFM). While SPM encompasses various techniques, AFM is a specific type that uses a cantilever with a sharp tip to scan surfaces at the nanoscale. Both roles require similar credentials and work environments, but AFM specialists focus specifically on atomic-level surface characterization.