Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Postdoctoral Fellow (PREP0004165)
Gaithersburg, MD · On-site
$53K - $72K/yr
This work is on the frontier of experimental condensed matter physics, and combines several experimental modalities, including scanning tunneling microscopy, atomic force microscopy, electron ...
Postdoctoral Fellow (PREP0004165)
Gaithersburg, MD · On-site
$53K - $72K/yr
This work is on the frontier of experimental condensed matter physics, and combines several experimental modalities, including scanning tunneling microscopy, atomic force microscopy, electron ...
Post Doctoral Industrial Scientist
Santa Barbara, CA · On-site
$75K - $90K/yr
The Post Doctoral Industrial Scientist will drive the development of innovative Atomic Force Microscopy (AFM) applications. In this role, you will translate customer needs into practical measurement ...
Post Doctoral Industrial Scientist
Santa Barbara, CA · On-site
$75K - $90K/yr
The Post Doctoral Industrial Scientist will drive the development of innovative Atomic Force Microscopy (AFM) applications. In this role, you will translate customer needs into practical measurement ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
N1 Metrology Technician
Austin, TX · On-site
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
N1 Metrology Technician
Austin, TX · On-site
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.) * The ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, CD Verity, Film Thickness measurement tools (KLA UVxxPIN), Defect ...
Overnight Atomic Force Microscopy information
See salary details
$15K - $48.8K
2% of jobs
$48.8K - $82.6K
2% of jobs
$82.6K - $116.5K
6% of jobs
$116.5K - $150.3K
5% of jobs
$150.3K - $184.1K
2% of jobs
$201K is the 25th percentile. Wages below this are outliers.
$184.1K - $217.9K
14% of jobs
The median wage is $245.3K / yr.
$217.9K - $251.7K
22% of jobs
$251.7K - $285.5K
13% of jobs
$297.6K is the 75th percentile. Wages above this are outliers.
$285.5K - $319.4K
22% of jobs
$319.4K - $353.2K
7% of jobs
$353.2K - $387K
3% of jobs
$15K
$241.3K
$387K
How much do overnight atomic force microscopy jobs pay per year?
What is the difference between Overnight Atomic Force Microscopy vs Overnight Scanning Electron Microscope Operator?
| Aspect | Overnight Atomic Force Microscopy | Overnight Scanning Electron Microscope Operator |
|---|---|---|
| Credentials | Typically requires a degree in physics, materials science, or engineering; specialized training in AFM techniques | Requires a degree in physics, materials science, or related fields; training in SEM operation and sample preparation |
| Work Environment | Laboratory settings with cleanroom conditions; often involves detailed surface analysis | Laboratories or industrial facilities; focuses on imaging and analyzing samples with SEM |
| Industry Usage | Research institutions, nanotechnology, materials development | Manufacturing, quality control, research labs |
Both roles involve advanced microscopy techniques, require similar educational backgrounds, and are used in research and industrial settings. The main difference lies in the specific equipment operated and the type of analysis performed, with AFM focusing on surface topography at the nanoscale and SEM providing detailed imaging of sample morphology.
What cities are hiring for Overnight Atomic Force Microscopy jobs?
Cities with the most Overnight Atomic Force Microscopy job openings:
What are the most commonly searched types of Atomic Force Microscopy jobs?
The most popular types of Atomic Force Microscopy jobs are:
What states have the most Overnight Atomic Force Microscopy jobs?
States with the most job openings for Overnight Atomic Force Microscopy jobs include:
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The top searched job categories for Overnight Atomic Force Microscopy jobs are:

Other
Posted 4 days ago
Job description
Primary Responsibilities:
- The candidate(s) selected will be responsible for performing scheduled and unscheduled maintenance in the ATMC Photo/Metro/AMHS Equipment area.
- Maintain, repair, upgrade, and monitor wafer fabrication equipment in Metrology (4-point probe, Atomic Force Microscopy, CDSEM, Film Thickness measurement tools, Defect inspection tools, etc.)
- The tasks include, but are not limited to, troubleshooting and repair of electrical/electronic systems, pneumatic and mechanical systems, scheduled maintenance, consumable changes, and various other activities relevant to the success of the area.
- Complete documentation and train others on equipment maintenance.
- While performing the duties of this job, the applicant will be required to communicate effectively using both written and verbal skills
- The applicant will also be required to stand for long periods of time (up to 10 hours) and should be physically able to do so in addition to occasionally stooping and or crawling in confined spaces
- The applicant must be able to lift and carry objects up to 50 pounds.
Qualifications:
- Education Requirements: AS, AAS in electronics or other industrial engineering, or related is preferred. Education requirements can be satisfied by equivalent experience.
- Specific knowledge of the Maintenance job functions are required. Minimum of 8 years of experience in the semiconductor industry.
- AA degree in Electronics or related discipline and 5 years technical maintenance experience, or an equivalent combination of education and experience may be acceptable.
- Minimum 5 years of experience with the Metrology/Defect area.
- Excellent verbal and written communication skills and demonstrate excellent problem-solving skills
- Solid understanding of both SPC and FDC and work to improve overall equipment performance based on these types of controls
- Problem solving skills and have excellent interaction and communication with all Operations and Engineering personnel
- Ability to interface with other internal and external groups to ensure all safety, performance, and reliability requirements are satisfied
More information about NXP in the United States...
NXP is an Equal Opportunity/Affirmative Action Employer regardless of age, color, national origin, race, religion, creed, gender, sex, sexual orientation, gender identity and/or expression, marital status, status as a disabled veteran and/or veteran of the Vietnam Era or any other characteristic protected by federal, state or local law. In addition, NXP will provide reasonable accommodations for otherwise qualified disabled individuals.
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