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Fib Tem Electron Microscopy Jobs (NOW HIRING)

Adecco

FIB Technician

Santa Clara, CA · On-site

$33 - $36.50/hr

... electron microscopy (TEM). · Perform SEM/FIB system and routine maintenance procedures such as flash, plasma cleaning, and image calibrations. · Perform routine troubleshoot procedures, identify ...

Adecco

FIB Technician

Santa Clara, CA

$30 - $31.50/hr

... electron microscopy (TEM). · Perform SEM/FIB system and routine maintenance procedures such as flash, plasma cleaning, and image calibrations. · Perform routine troubleshoot procedures, identify ...

Axle

Electron Microscopy Specialist

Hamilton, MT · On-site

$70K - $80K/yr

Operate and help maintain TEM and/or SEM instruments, including troubleshooting when needed. * Work ... Focused Ion Beam-SEM (FIB-SEM) * Cryo-electron microscopy (cryo-EM) * Familiarity with image ...

Axle

Electron Microscopy Specialist

Hamilton, MT · On-site

$70K - $80K/yr

Operate and help maintain TEM and/or SEM instruments, including troubleshooting when needed. * Work ... Focused Ion Beam-SEM (FIB-SEM) * Cryo-electron microscopy (cryo-EM) * Familiarity with image ...

Axle

Electron Microscopy Specialist

Hamilton, MT

Operate and help maintain TEM and/or SEM instruments, including troubleshooting when needed. * Work ... Focused Ion Beam-SEM (FIB-SEM) * Cryo-electron microscopy (cryo-EM) * Familiarity with image ...

ExxonMobil

Electron Microscopy Technologist

Spring, TX · On-site

Proficiency with sample preparation techniques for electron microscopy. * Ability to manage lab ... Experience with one or more of the following additional microanalysis tools: SEM, FIB, TEM, SIMS ...

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Fib Tem Electron Microscopy information

What is FIB-TEM electron microscopy?

FIB-TEM Electron Microscopy combines Focused Ion Beam (FIB) technology with Transmission Electron Microscopy (TEM) to prepare and analyze ultra-thin samples at the nanoscale. FIB is used to precisely cut and manipulate materials, allowing researchers to create thin lamellae suitable for TEM analysis. This technique is widely used in materials science, nanotechnology, and semiconductor industries to study the structure, composition, and properties of materials at atomic resolution.

What are the key skills and qualifications needed to thrive as a FIB-TEM electron microscopy specialist?

To thrive as a FIB-TEM Electron Microscopy Specialist, you need a strong background in materials science, physics, or a related field, often supported by an advanced degree and hands-on laboratory experience. Proficiency in using focused ion beam (FIB) and transmission electron microscopy (TEM) instruments, as well as associated software for image analysis and sample preparation, is essential. Attention to detail, problem-solving abilities, and effective communication are crucial soft skills for accurate data interpretation and collaboration with research teams. Mastery of these skills ensures reliable sample analysis, high-quality imaging, and successful project outcomes in research and industrial settings.

What are some common challenges faced by professionals working in FIB-TEM electron microscopy, and how can they be addressed?

Professionals in FIB-TEM electron microscopy often encounter challenges such as sample preparation difficulties, contamination, and instrument maintenance. Preparing high-quality, thin samples without introducing damage or artifacts requires precision and experience. Regular calibration and cleanliness of the equipment are crucial to obtaining accurate results. Collaborating closely with materials scientists, engineers, and other microscopy specialists helps in troubleshooting issues and improving workflow efficiency.

What is the difference between Fib Tem Electron Microscopy vs Fib Tem Electron Microscopy?

AspectFib Tem Electron Microscopy
CredentialsTypically requires a degree in materials science, physics, or related fields; training in electron microscopy techniques
Work EnvironmentLaboratory settings with advanced microscopy equipment, often in research or industrial labs
Industry UsageUsed in materials research, nanotechnology, and quality control
Job FocusPreparing samples, operating electron microscopes, analyzing microscopic structures

Fib Tem Electron Microscopy specialists focus on operating and maintaining electron microscopes to analyze material structures at the nanoscale. They often share similar credentials and work environments with other microscopy technicians, but their specific expertise is tailored to fiber and tissue sample analysis. Understanding these nuances helps clarify the role's scope within scientific and industrial settings.

What other helpful pages are available for Fib Tem Electron Microscopy?

Other pages related to Fib Tem Electron Microscopy:

Infographic showing various Fib Tem Electron Microscopy job openings in the United States as of September 2026, with employment types broken down into 80% Full Time, 19% Part Time, and 1% Contract. Highlights an 80% Physical, 2% Hybrid, and 18% Remote job distribution.

FIB Technician

Santa Clara, CA • On-site

Adecco
Recruiting and Staffing Services • 10K+ employees
Learn more about Adeccoexternal

$33 - $36.50/hr

Full-time

Medical, Dental, Vision, Life, Retirement, PTO

This job post has expired today. Applications are no longer accepted.

Job description

Adecco is hiring immediately for a FIB Technician with a local client in Santa Clara, CA. Pay is $33.00/hr. - $36.50hr.  

Duties:

·       Shift: Friday-Sunday 5:00pm-5:00am (12Hr Day).

·       Prepare samples for experiments, including sample coating, wafer cleaving, mounting/unmounting samples, and preparing jobs for experimentation to evaluate the performance of the process system.

·       Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions, and identify cutting locations based on pattern instructions.

·       Operate metrology tools in the FIB & TEM lab to understand cross-section or top-view critical dimensions (CD), identify patterns of interest, understand image quality requirements and sample/beam interactions to determine optimized conditions, and complete requested jobs under limited supervision after training.

·       Understand the basic principles of scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM).

·       Perform SEM/FIB system and routine maintenance procedures such as flash, plasma cleaning, and image calibrations.

·       Perform routine troubleshoot procedures, identify problems, restart or standby the tool.

·       Coordinate instrument repair and maintenance.

·       Interface with requestors, understand their detailed requirements, and communicate results. Coordinate with engineering on job request status.

·       Help monitor job queue and maintain lab throughput.

·       Document redo and lessons learned to lower redo rate.

·       Adhere to lab protocols and SOPs.

·       Operate supportive metrology equipment in a lab environment.

·       Operate supportive metrology equipment for FIB-TEM lamella samples.

Qualifications:

Click on apply now for immediate consideration for this FIB Technician in Santa Clara, CA. We look forward to hearing from you!

Benefit offerings include medical, dental, vision, life insurance, short-term disability, additional voluntary benefits, EAP program, commuter benefits and 401K plan. Our program provides employees the flexibility to choose the type of coverage that meets their individual needs. Available paid leave may include Paid Sick Leave, where required by law; any other paid leave required by Federal, State, or local law; and Holiday pay upon meeting eligibility criteria.


Pay Details: $33.00 to $36.50 per hour
Benefit offerings available for our associates include medical, dental, vision, life insurance, short-term disability, additional voluntary benefits, EAP program, commuter benefits and a 401K plan. Our benefit offerings provide employees the flexibility to choose the type of coverage that meets their individual needs. In addition, our associates may be eligible for paid leave including Paid Sick Leave or any other paid leave required by Federal, State, or local law, as well as Holiday pay where applicable.
Equal Opportunity Employer/Veterans/Disabled
Military connected talent encouraged to apply
To read our Candidate Privacy Information Statement, which explains how we will use your information, please navigate to https://www.adecco.com/en-us/candidate-privacy
The Company will consider qualified applicants with arrest and conviction records in accordance with federal, state, and local laws and/or security clearance requirements, including, as applicable:
  • The California Fair Chance Act
  • Los Angeles City Fair Chance Ordinance
  • Los Angeles County Fair Chance Ordinance for Employers
  • San Francisco Fair Chance Ordinance

Massachusetts Candidates Only: It is unlawful in Massachusetts to require or administer a lie detector test as a condition of employment or continued employment. An employer who violates this law shall be subject to criminal penalties and civil liability.