The Roleย
Weย areย seekingย a highly experienced Senior Design-for-Test (DFT) Engineer to lead and drive DFT architecture and implementation for complex mixed-signal SOCs. This role requires deepย expertiseย inย memory BIST and TAP controller insertionย at RTL,ย scan insertion andย ATPG, and test strategy development across digital and mixed-signal domains.ย You will play a critical role in ensuring high test coverage, manufacturability, and first-pass silicon success while collaborating closely with design, verification, and physical design teams.ย ย
Responsibilitiesย
- Define and implement DFT architecture for mixed-signal SoCs, including scan, MBIST, LBIST, and boundaryย scan.ย
- Lead RTL-level DFT insertion, scan chain insertion and optimization, test point insertion, and low-power DFT methodologies.ย
- Own ATPG flow development and execution by generating high-quality stuck-at, transition, and path delay test patterns. Drive coverage closure and pattern optimization and debug pattern failure and silicon correlation.ย ย
- Develop and integrate DFT strategies for mixed-signal blocks, including wrapper-based approaches, and analog test interfaces and BIST solutions.ย
- Collaborate with RTL, DV, and PD teams to ensure clean DFT integration at RTL and gate-level, andย timing and physical constraints alignment (scan reordering, compression, etc.).ย
- Drive DFT verification and signoff, including Scan/ATPG coverage metrics, DRC/Lint checks (DFT rule compliance), gate-levelย simulationย and pattern validation.ย
- Support bring-up and silicon debug activities by analyzing tester failures, yield issues, and ATPG pattern correlation with silicon behavior.ย
- Contribute toย methodologyย development, automation, and flow improvements.ย
Qualificationsย
- B.S. orย M.S. in Electrical Engineeringย or related field.ย
- 7+ years of experience inย DFT for complex SoCs.ย
- Strong hands-on experience withย RTL DFT insertion (scan, compression, test points), andย ATPG tools and flows.ย
- Deep understanding ofย scan architectures,ย compression techniques, fault models (stuck-at, transition, bridging, path delay), coverage analysis and closure strategies.ย
- Experience with low-power DFT techniques.ย
- Familiarity with mixed-signal integration challenges and test methodologies.ย
- Strong debugging skills across RTL, gate-level, and silicon.ย
Nice to Haveย
- Experience with MBIST/LBIST implementation and memory repair flows.ย
- Knowledge of IEEE 1149.x (JTAG/boundary scan) standards.ย
- Experience with multi-voltage domain and power-aware DFT.ย
- Exposure to physical design impacts on DFT (scan chain reordering, congestion, timing).ย
- Scripting experienceย forย automation.ย
- Experience in high-speed interfaces (SerDes) or RF/mixed-signal SoCs.ย
- Prior involvement in A0 silicon bring-up and yield ramp.ย
- Experienceย working in cross-functional, geographically distributed teams.ย ย
Compensation and Benefits:
- Base salary range for this role is $170,000 - $250,000 + equity in the company
- Salary will be based on several factors including, but not limited to: knowledge and skills, education, and experience level
- Comprehensive benefits package including paid time off, medical/dental/vision/ coverage, life insurance, paid parental leave, and many other perks